High-current probeTerminals, busbar contacts
Product Overview
High-current probes are used for electrical testing by supplying high current while making contact with electronic components such as terminals, contacts, and busbars.
Designed with low internal resistance to enable precise signal transmission and measurement, these probes are available in a standard lineup covering rated currents from 20A to 400A.
We offer a variety of probes featuring different tip shapes, tip diameters, spring forces, and materials to suit specific test points.
Carefully selected probe specifications ensure reliable, repeatable contact.
Applications: Aging tests, burn-in tests, formation tests, and DCIR measurement tests.
Product Image & Configuration Examples
Characteristics/specification
Example of a representative high-current probe: **High-Current Probe HSS-623**
◆ Designed for low contact and internal resistance, it ensures stable high-current delivery
while minimizing heat generation and voltage drop.
◆ The probe body (HSS-623…M) features an M5 screw mount,
allowing for secure fastening and replacement using a wrench on the hex section (SW6).
◆ Receptacles (KS-623 series) are available in M5 screw-mount and solder-cup types,
enabling wiring configurations tailored to your equipment setup.
◆ A wide range of tip shapes, diameters, spring forces, and materials is available,
accommodating diverse test points such as terminals, busbars, and battery tabs.
◆ Contact stability is maintained even with repeated use,
ensuring highly reproducible measurements during long-duration or high-cycle testing processes like aging and formation.
◆ The standard lineup covers rated currents from 20A to 400A,
allowing for the optimal choice based on specific application requirements.
Product line-up
| Grid size / Series (max.current) |
Standard high current test probes (press-in) |
Standard high current test probes (screw-in) |
Short-stroke and long-stroke high current test probes |
Dipole high current probes (Kelvin probes) |
High current clamps (flat / round) |
Robust high current probes (probes / contact terminal) |
| ≥2.54 mm (≥100 Mil) |
HSS-118 (20 A) | HSS-118 M (20 A) | HSS-827 M (20 A) | – | – | – |
| ≥4.00 mm (≥160 Mil) |
HSS-120 (30 A) | HSS-120 M (30 A) | HSS-520/M (30 A) | VK-541 (10 A) | KK-541 (20 A) | – |
| ≥5.08 mm (≥200 Mil) |
HSS-150 (50 A) | HSS-150 M (50 A) | HSS-552 M (50 A) HSS-150 H/MH (50 A) |
– | – | – |
| 6.0 to 7.5 mm (250 to 300 Mil) |
– | HSS-621 M (75 A) HSS-623 M (100 A) |
– | HSS-624 M (100 A) | HKF-617 (40 A) HKR-694 (40 A) |
– |
| 12.0 to 35.0 mm (470 to 1400 Mil) |
– | – | – | – | HKR-612M (100 A) HKR-672M (200 A) |
HSS-2259 (25 A) to HSS-2532 (400 A) |
| Catalog download |
78/80/82 | 79/81/83/84-85 | 86-89 | 92-93 | 94-98 | 99 |
[Probe descriptions]
|
*Standard high current test probe Covers rated currents from 20 A to 100 A as standard. |
*Dipole high current probes (Kelvin probes) 4-wire probes for 4-terminal measurement. |
|
*Short-stroke and long-stroke probe Used where the available space is limited or where a long stroke is required. |
*High current clamps (round / flat) Also suitable for flat blade pins such as those used in plug connectors, |
|
*International standard test probe A high current probe without a collar. |
*Robust high current probes Used in locations where harsh environmental conditions, lateral forces or vibration may occur. |
Product specifications
| High current probe (HSS) version |
Series | Grid size (≥mm) |
Working stroke (mm) |
Max stroke (mm) |
Current rating (A) |
Spring force (N) | Installation height with receptacle (KS) (mm) |
Min probe length (mm) |
Compatible test probes (GKS) |
Catalog download | ||
| min | max | min | max | |||||||||
| Standard high current test probes (press-in/screw-in) |
HSS-118 | 2.54 | 4 | 5.3 / 8 | 20 | 1.5 | 3 | 10.5 | 18.5 | 32.3 | GKS-112 | 78 |
| HSS-118 M | 2.54 | 4 | 5.3 / 8 | 20 | 1.5 | 3 | 10.5 | – | 35.3 | GKS-112 M | 79 | |
| HSS-120 | 4 | 4 | 5.3 | 30 | 1.5 | 3 | 10.5 | 18.5 | 27.3 | GKS-113 | 80 | |
| HSS-120 M | 4 | 4 | 5.3 | 30 | 1.5 | 3 | 10.5 | – | 28.3 | GKS-113 M | 81 | |
| HSS-150 | 5.08 | 4.4 | 5.5 | 50 | 3 | 10 | 10.8 | – | 38.5 | GKS-854 | 82 | |
| HSS-150 M | 5.08 | 4.4 | 5.5 | 50 | 3 | 10 | 10.8 | – | 43.1 | GKS-854 M | 83 | |
| HSS-621 M | 6.35 | 4.4 | 5.5 | 75 | 5 | 10 | 10.8 | – | 43.1 | – | 84 | |
| HSS-623 M | 7.6 | 4.4 | 5.5 | 100 | 7 | 15 | 10.8 | – | 52.1 | – | 85 | |
| Short-stroke high current test probes |
HSS-827 M | 2.54 | 3.5 | 4.5 | 20 | 1.5 | 2.5 | 8.7 | – | 19.5 | GKS-427 M | 86 |
| HSS-520 (M) | 4 | 2.8 | 3.5 | 30 | 1.5 | – | 7.3 | 7.4 | 15.1 | GKS-913/M | 87 | |
| HSS-552 M | 5.08 | 2 | 2.5 | 50 | 2 | – | 7.5 | – | 17.1 | – | 88 | |
| Long-stroke high current test probes |
HSS-150H (MH) | 5.08 | 7.4 | 8.5 | 50 | 3 | 10 | 13.8 | – | 46.1 | – | 89 |
| International standard test probes |
HSS-005 | 4.75 | 4.4 | 6.35 | 40 | 3 | 5 | 8.9 | – | 36.1 | GKS-005 | 90 |
| Dipole high current test probes / 4-wire clamp |
HSS-624 M | 7.6 | 4.4 | 5.5 | 100 | 9 | – | 10.8 | – | 61.8 | – | 92 |
| VK-541 | 3.5 | 3.5 | 6.5 | 10 | – | – | 19.1 | – | 53.5 | – | 93 | |
| High current clamps (flat / round) |
HKF-617 | 5.5 | 4.4 | 5.5 | 20/40 | 10 | – | 27.9 | – | 57.9 | – | 94 |
| KK-541 | 3.5 | 3.5 | 6.5 | 20 | – | – | 16.35 | 16.55 | 34.35 | – | 95 | |
| HKR-612 M | 10-12.5 | 4.4 | 5.5 | 35/35/100 | 10 | 20 | 29.5 | – | 57 | – | 96 | |
| HKR-672 M | 18-22 | 4 | 5.5 | 200 | 20 | – | 33.5 | 34.7 | 72.7 | – | 97 | |
| HKR-694 | 5.5 | 4.4 | 5.5 | 15 | 10 | – | 26.2 | – | 56.2 | – | 98 | |
| Robust high current test probes (probe / contact terminal) |
HSS-2259 | 12 | 7 | 9.5 | 25 | 10 | – | 37.5 | – | 57.5 | – | 99 |
| HSS-2513 | 16 | 7 | 10.5 | 35 | 12 | – | 52.5 | – | 79.5 | – | 99 | |
| HSS-2516 | 20 | 7 | 12 | 100 | 17 | – | 54.2 | – | 81.2 | – | 99 | |
| HSS-2526 | 30 | 7 | 11 | 200 | 58 | – | 53 | – | 90 | – | 99 | |
| HSS-2532 | 35 | 7 | 11 | 400 | 116 | – | 53 | – | 114 | – | 99 | |
PRODUCTS
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Inspection Pro Series
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Inspection Pro Series
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Inspection Pro Series
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Inspection Pro Series
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Printed Circuit Board Inspection
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Printed Circuit Board Inspection
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Printed Circuit Board Inspection
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Printed Circuit Board Inspection
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Test Probe