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ICT/FCT ProbePCB / Connector Contacts

Product Overview

Spring-loaded test probes (GKS) are used to make contact with pads/terminals on printed circuit boards or electronic components to perform electrical testing.
We offer an extensive lineup of spring-loaded test probes.
Depending on the test point being contacted, we provide a variety of tip shapes, tip diameters, spring forces, and materials.
Selecting the optimal test probe specifications ensures reliable, repeatable contact.
We also offer custom-designed probes and complete test fixtures tailored to your specific application requirements.

Typical applications: In-Circuit Testers (ICT) and Functional Testers (FCT).

GKS-100 probe dimensions KS-100 30G probe dimensions

Product line-up

Probes and contacted components

Probes and contacted components (example of application)

Grid size /
series		 International standard test probes INGUN
E-TYPE		 Rotating
Probe		 Bead Probe Fine pitch Metric standard
Standard
stroke		 Long stroke Wireless Short test
probes
≥0.63 mm
(≥25 Mil)		 – – – – – – – GKS-038
GKS-061		 –
≥1.00 mm
(≥40 Mil)		 GKS-040 – KS-040 WL – – – – GKS-080
GKS-081		 –
≥1.27 mm
(≥50 Mil)		 GKS-050 GKS-015 KS-050 WL GKS-550 E-050 DKS-050 GKS-050 GKS-069
GKS-079/181		 –
≥1.91 mm
(≥75 Mil)		 GKS-075 GKS-035 KS-075 WL GKS-001 E-075 DKS-075 GKS-075 – –
≥2.54 mm
(≥100 Mil)		 GKS-100 GKS-135 KS-100 WL GKS-002 E-100
E-422		 DKS-100 GKS-100 – GKS-112
GKS-912
3.0 to 5.0 mm
(125 to 200 Mil)		 – – – GKS-003
GKS-004/005		 – – – – GKS-113/913
GKS-103/503
GKS-854
Catalog
download
Page		 P.24-29 P.30-32 P.33 P.34-40 P.42-43 P.44-46 P.48 P.52-57 P.61-72

[Probe descriptions]

*International standard spring-loaded test probes (GKS)

Standard Stroke: standard stroke (4.3 mm)
Long Stroke: long stroke (9.3 mm)
Wireless: with wireless receptacles, the probes can be connected via an interface board or similar.

*Short / robust test probes

Compact, robust test probes for applications with limited space.

*INGUN E-TYPE® test probes

E-type probes have a higher initial spring force than standard probes.
This makes it easier to penetrate insulating layers (such as flux) on contact.
The final spring force is the same as that of standard probes.

*Rotating test probes

The probe rotates during the stroke,
making it easier to penetrate insulating layers (such as flux).

*Bead test probes

Used to contact small solder beads directly (bead probe technology).
Ensures optimal contact with beads of various shapes, configurations and surfaces.

*Flying probe

Test probes for flying probe systems.

*Fine pitch test probes

Probes for contacting tiny test points at a fine pitch.

*Metric test probes (metric standard)

Probes with a collar for increased rigidity.

 

Product specifications

Test probe version Series Grid size
(≥ mm)		 Working
stroke
(mm)		 Max.
stroke
(mm)		 Current
rating (A)		 Spring min (N) Installation heights
with receptacles
(mm) v = variable		 Shortest
probe
(mm)		 Catalog
download
Page
min max min max v
Standard stroke GKS-040 1 4.3 6.35 2 0.8 – 16 18 v 35.9 P.24
GKS-050 1.27 4.3 6.35 2 – 3 1 2 16 18 v 43.2 P.25
GKS-075 1.91 4.3 6.35 3 – 4 0.6 2.8 10.5 23 v 33.1 P.26
GKS-100 2.54 4.3 6.35 5 – 8 0.6 4 10.5 25.5 v 33.4 P.28
Long stroke GKS-015 1.27 8 10 2 – 3 1 1.5 21.3 23.3 v 48.5 P.30
GKS-035 1.91 8 10 3 – 4 1.2 – 14.2 23.7 v 36.8 P.31
GKS-135 2.54 9.3 11.5 5 – 8 1.5 3 15.8 21.3 v 38.7 P.32
Wireless receptacles KS-040 WL 1 2.5 4 2 – 3 1 – – 16 v 43.4 P.33
KS-550 WL 1.27 2.5 4 2 – 3 1 – – 16 v 43.1 P.33
KS-075 WL 1.91 2.5 4 2 – 3 1 – – 16 v 43.1 P.33
KS-100 WL 2.54 2.5 4 2 – 3 1 – – 16 v 43.1 P.33
Short / robust test
probes (GKS)		 GKS-550 1.27 4.3 6.35 2 – 3 1 1.5 – 16 v 34.6 P.34
GKS-101 1.91 4 5.3 3 – 4 0.5 1.5 12.5 14 – 27.3 P.35
GKS-001 1.91 2.4 3 3 – 4 0.6 1.5 – 8.5 v 17 P.36
GKS-002 2.54 2.7 4.1 5 – 8 1 2.8 – 12.1 v 24.6 P.37
GKS-003 3.18 4.4 6.35 5 – 8 1.2 3 – 16 v 33.1 P.38
GKS-004 4.75 4.4 6.35 6 – 8 1.5 3 – 16.5 v 33.6 P.39
GKS-005 4.75 4.4 6.35 6 – 8 2 5 – 16.5 v 27.2 P.40
INGUN E-TYPE® E-050 1.27 4.3 6.35 2 – 3 2 – 16 18 v 43.2 P.42
E-075 1.91 4.3 6.35 3 – 4 2 2.8 10.5 20 v 33.1 P.42
E-100 2.54 4.3 6.35 5 – 8 2 3 10.5 25.5 v 33.4 P.43
E-422 2.54 6.4 8 5 – 8 2.25 3 16.2 24 v 38.4 P.43
Rotating test probe
(DKS)		 DKS-050 1.27 4.3 6.35 2 – 3 1.5 2 16 18 v 43.2 P.44
DKS-075 1.91 4.3 6.35 3 – 4 1 2 10.5 20 v 33.1 P.44
DKS-100 2.54 4.3 6.35 5 – 8 1 3 10.5 25.5 v 33.4 P.44
GKS-725 2.54 4 5 3 – 4 1.5 – 13 16 – 30 P.45
GKS-713 4.5 4 5 5 – 8 1.5 5 13.2 18.2 – 40 P.46
Bead probes GKS-050 1.27 4.3 6.35 2 – 3 1 2 16 18 v 43.2 P.48
GKS-075 1.91 4.3 6.35 3 – 4 0.6 2.8 10.5 23 v 33.1 P.48
GKS-100 2.54 4.3 6.35 5 – 8 0.6 4 10.5 25.5 v 33.4 P.48
GKS-135 2.54 9.3 11.5 5 – 8 1.5 3 15.8 21.3 v 38.7 P.48
GKS-550 1.27 4.3 6.35 2 – 3 1 1.5 – 16 v 34.6 P.48
Flying probe GKS-112 MD 2.54 4 5.3 / 8 5 – 8 0.6 3 14.7 21.6 – 40 P.49
Fine pitch GKS-038 0.635 2 2.5 1 0.4 – 4 – – 24 P.52
GKS-061 0.8 2.5 3.5 2 0.6 – 5.5 – – 36.2 P.52
GKS-080 1 3 3.8 3 0.8 – 10.5 – – 19.3 P.53
GKS-081 1 5.5 7.5 3 0.8 – 10.5 16 – 34.6 P.54
GKS-069 1.27 2.2 2.8 3 0.7 1 6.3 6.7 v 16.5 P.55
GKS-079 1.27 1 1.2 3 1.3 – 3.2 – – 14.5 P.56
GKS-181 1.27 5.5 7.5 2 – 3 0.8 1.5 10.5 16 – 34.9 P.57
Metric standard GKS-112 2.54 4 5.3 / 8 5 – 8 0.6 5 26.3 32.3 v 40.3 P.61
GKS-912 2.54 4 5 5 – 8 0.6 5 10.2 26 v 32 P.62
GKS-422 2.54 6.4 8 5 – 8 0.8 5 16.2 24 v 38.4 P.63
GKS-412 2.54 8 9.8 5 – 8 0.6 5 15 30.8 v 37.8 P.64
GKS-204 2.54 8 10 5 – 8 0.8 3 16.2 23.2 – 47.9 P.65
GKS-102 2.54 4.8 6.5 5 – 8 1.5 5 12.75 13.75 – 42.5 P.66
GKS-502 2.54 5.6 7 5 – 15 0.8 5 12.2 13.2 – 39.1 P.67
GKS-113 4 4 5.3 5 – 8 0.3 5 10.5 18.5 – 27.3 P.68
GKS-913 4 2.8 3.5 5 – 8 0.8 2.5 7.3 9 – 15.1 P.69
GKS-103 4 4.8 6 5 – 8 0.8 5 12.55 – – 29.3 P.70
GKS-503 4 5.6 7 5 – 15 1.5 5 13.25 – – 38 P.71
GKS-854 5.08 4.4 5.5 10 – 12 3 5 10.8 – – 38.5 P.72

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